发明名称 METHOD OF ETCHING DIELECTRIC MATERIALS
摘要 The invention relates to a method for dry etching of a silicon oxide substrate. The method comprises the steps of generating a non-etch plasma from an inert gas, subjecting the silicon oxide substrate to the resulting plasma to bring the silicon oxide to a stable elevated temperature, generating an etch plasma from a reactive gas or gas mixture containing a reactive gas, and subjecting the silicon oxide substrate, which is at the stable elevated temperature, to the resulting etch plasma to effect etching of the substrate. By subjecting the silicon oxide sample to an inert gas plasma prior to the etch step, and thus stabilizing the temperature of the silicon oxide, it has been found that a dramatic improvement in the verticality of etched side walls can be obtained.
申请公布号 WO02097866(A2) 申请公布日期 2002.12.05
申请号 WO2002CA00785 申请日期 2002.05.28
申请人 LNL TECHNOLOGIES CANADA INC.;LAMONTAGNE, BORIS;RENDER, WILLIAM;DELAGE, ANDRE;JANZ, SIEGFRIED;ERICKSON, LYNDEN;XU, DAN-XIA;CHEBEN, PAVEL;CHARBONNEAU, SYLVAIN 发明人 LAMONTAGNE, BORIS;RENDER, WILLIAM;DELAGE, ANDRE;JANZ, SIEGFRIED;ERICKSON, LYNDEN;XU, DAN-XIA;CHEBEN, PAVEL;CHARBONNEAU, SYLVAIN
分类号 C23C16/40;H01L21/00;H01L21/311;H01L21/461 主分类号 C23C16/40
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