| 摘要 |
<p>The invention concerns an inprocess inspection of a workpiece (1), such as a ceramic tile, after the workpiece has been shaped into its final form. The workpiece is moved past a beam of light (48) which is directed onto the manufactured surfaces of the workpiece. The pattern of light incident upon the workpiece is sensed (49) and then compared with a standard form of light pattern so as to determine any defects in the sides and chamfers of the workpiece. Conveniently, the workpiece is movable on a conveyor belt (41, 42) past illuminating (48) and sensing (49) devices, the latter of which converts the sensed pattern into electrical signals preferably digital signals, which are then compared with digital signals corresponding to a standard form of light pattern.</p> |
