发明名称 Pattern collation device and pattern collating method thereof, and pattern collation program
摘要 A pattern collation device for comparing and collating graphic forms includes a deformation estimating unit for estimating deformation generated in a graphic form to be examined which is a graphic form as an object of examination based on information about a feature point indicative of features in each of the graphic form to be examined in question and a model graphic form as a graphic form based on which comparison is made, a deformation correcting unit for correcting the graphic form to be examined in question based on information about the deformation estimated by the deformation estimating unit and a similarity determining unit for comparing the graphic form to be examined whose deformation is corrected by the deformation correcting unit with the model graphic form as a graphic form based on which comparison is made to calculate similarity therebetween.
申请公布号 US2002181782(A1) 申请公布日期 2002.12.05
申请号 US20020106444 申请日期 2002.03.27
申请人 NEC CORPORATION 发明人 MONDEN AKIRA
分类号 G06T7/00;G06K9/46;G06K9/64;(IPC1-7):G06K9/62 主分类号 G06T7/00
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