发明名称 |
Pattern collation device and pattern collating method thereof, and pattern collation program |
摘要 |
A pattern collation device for comparing and collating graphic forms includes a deformation estimating unit for estimating deformation generated in a graphic form to be examined which is a graphic form as an object of examination based on information about a feature point indicative of features in each of the graphic form to be examined in question and a model graphic form as a graphic form based on which comparison is made, a deformation correcting unit for correcting the graphic form to be examined in question based on information about the deformation estimated by the deformation estimating unit and a similarity determining unit for comparing the graphic form to be examined whose deformation is corrected by the deformation correcting unit with the model graphic form as a graphic form based on which comparison is made to calculate similarity therebetween.
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申请公布号 |
US2002181782(A1) |
申请公布日期 |
2002.12.05 |
申请号 |
US20020106444 |
申请日期 |
2002.03.27 |
申请人 |
NEC CORPORATION |
发明人 |
MONDEN AKIRA |
分类号 |
G06T7/00;G06K9/46;G06K9/64;(IPC1-7):G06K9/62 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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