发明名称 Semiconductor memory device having a floating gate and method of manufacturing the same
摘要 A semiconductor memory device having a floating gate and a method of manufacturing the same, where a conductive layer for a floating gate is deposited on a semiconductor substrate and etched to form a conductive layer pattern. An annealing of the semiconductor substrate is carried out in an ambient atmosphere of hydrogen gas. Alternatively, an entire surface of the conductive layer pattern is etched by a dry etching method or a wet etching method. As a result, at least one edge of the conductive layer pattern is rounded, which reduces the likelihood that an electric field is concentrated at the edge and reduces a likelihood that the dielectric layer formed on the floating gate is thinner at the edge.
申请公布号 US2002179960(A1) 申请公布日期 2002.12.05
申请号 US20020144726 申请日期 2002.05.15
申请人 KANG MAN-SUG;HUH HYOUNG-JO 发明人 KANG MAN-SUG;HUH HYOUNG-JO
分类号 H01L27/115;H01L21/28;H01L21/8247;H01L29/788;(IPC1-7):H01L21/336 主分类号 H01L27/115
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