Direct Fourier imaging of specimens involves point- and line-wise illumination of specimen and point- and line-wise detection of light in light path defined by detector and optical arrangement

摘要

The method involves point- and line-wise illumination of the specimen (9) with a light beam, point- and line-wise detection of the light in a detection light path (10) defined by a detector (13) and an optical arrangement, whereby there is no objective in the illumination (2) or detection beam path, and representing the Fourier image of the specimen acquired by the detector on a display. AN Independent claim is also included for an arrangement for direct Fourier imaging of specimens.