发明名称 System for automatic analysis and processing of loss factors in test process analyzes raw and processed data according to component lots, test units and loading/unloading arrangements
摘要 The system has an arrangement for verifying test results per test cycle and determining if a new test is to be performed, a loading/unloading arrangement, a raw date generator, a test, index and loss time data processor, a data storage arrangement and a data analysis and output arrangement for analyzing raw and processed data according to the lots, test units and loading/unloading arrangements and outputting analyzed data via a user interface. The system has an arrangement for verifying test results per test cycle and determining if a new test is to be performed, a loading/unloading arrangement (15) for loading components for test in a lot into a test head and unloading tested elements with sorting by test results, a raw data generator (12), a data processor (22) for test time data, index time data based on the raw data and loss time data, a data storage arrangement (25) and a data analysis and output arrangement for analyzing raw and processed data according to the lots, test units (12) and loading/unloading arrangements and for outputting the analyzed output data via a user interface. AN Independent claim is also included for the following: a method of automatic analysis and processing of loss factors in test process.
申请公布号 DE10203761(A1) 申请公布日期 2002.12.05
申请号 DE20021003761 申请日期 2002.01.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KYU SUNG;CHUNG, AE YONG;KIM, SUNG OK
分类号 G01R31/26;G01R31/28;G06F17/00;(IPC1-7):G01R31/28 主分类号 G01R31/26
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