发明名称 TMR-Schichtsystem mit Diodencharakteristik
摘要 The invention relates to a TMR layer system consisting of a first ferromagnetic electrode layer (11), a dielectric barrier layer (10) and a second ferromagnetic layer (12) which are placed on top of each other in the above-mentioned sequence or which are arranged horizontally next to each other. The electric resistance of the layer system (10,11,12) depends upon the relative magnetic polarization direction of the first and second ferromagnetic electrode layer. The inventive TMR layer system is characterized in that at least one of the ferromagnetic electrode layers (11,12) has a voltage-dependent state charge carrier density, whereby the electric current voltage characteristic of the TMR layer system has diode behavior, or the dielectric barrier layer is embodied in such a way that it has a strongly asymmetrical tunnel behavior.
申请公布号 DE10123820(A1) 申请公布日期 2002.12.05
申请号 DE20011023820 申请日期 2001.05.16
申请人 INFINEON TECHNOLOGIES AG 发明人 BANGERT, JOACHIM
分类号 H01L27/22;(IPC1-7):H01L43/08 主分类号 H01L27/22
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