发明名称 Method for fabricating positionally exact surface-wide membrane masks
摘要 The membrane mask is based on an SOI substrate. In an existing or subsequently produced multilayer semiconductor/insulator/semiconductor-carrier-layer substrate, the inhomogeneous mechanical stresses in the semiconductor layer, which lead to undesirable distortions, are converted at least partly into a homogenous state prior to the structuring of the semiconductor layer. In order to accomplish this, either an additional layer structure is provided on an existing SOI substrate, or a modified layer structure is provided in the fabrication of the SOI substrate, or both.
申请公布号 US2002182895(A1) 申请公布日期 2002.12.05
申请号 US20020163007 申请日期 2002.06.05
申请人 BUTSCHKE JOERG;EHRMANN ALBRECHT;HAUGENEDER ERNST;LETZKUS FLORIAN;SPRINGER REINHARD 发明人 BUTSCHKE JOERG;EHRMANN ALBRECHT;HAUGENEDER ERNST;LETZKUS FLORIAN;SPRINGER REINHARD
分类号 G03F1/16;G03F1/20;(IPC1-7):H01L21/00 主分类号 G03F1/16
代理机构 代理人
主权项
地址