发明名称 |
POLISHING HEAD OF CMP APPARATUS |
摘要 |
PURPOSE: A polishing head of a CMP(Chemical Mechanical Polishing) apparatus is provided to polish uniformly a wafer by improving a structure of the polishing head. CONSTITUTION: A surface of a wafer(W) is contacted with a polishing pad. A back face of the wafer(W) is contacted with a polishing head(32). A main body(34) is formed with a housing(36), a base(38), and a retainer ring(40). The base(38) is used for supporting the housing(36). The retainer ring(40) is installed at an edge of a lower portion of the base(38) in order to prevent an escape of the wafer. The housing(36) is connected with a drive portion. The housing(36) has a circular upper face and a circular lower face. The housing(36) includes the first tube(42a). The second and the third tubes(42b,42c) are formed at a predetermined position apart from the first tube(42a). A base(38) is used for supporting the housing(36). The first chamber(44) is formed between the housing(36) and the base(38). A perforate plate(46) is installed at a lower portion of the main body(34). A plurality of through-holes(46a) are formed on the perforate plate(46). A separation plate(48) is formed between the base(38) and the perforate plate(46). An air cushion(50) is installed on an edge portion of the perforate plate(46). A membrane(52) is formed on a lower face of the perforate plate(46).
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申请公布号 |
KR20020090370(A) |
申请公布日期 |
2002.12.05 |
申请号 |
KR20010028360 |
申请日期 |
2001.05.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, MYEONG SIK;HONG, CHANG GI |
分类号 |
H01L21/304;B24B37/04;B24B41/06;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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