发明名称 METHOD AND APPARATUS OF IN-PROCESS INSPECTION
摘要 The invention concerns an inprocess inspection of a workpiece (1), such as a ceramic tile, after the workpiece has been shaped into its final form. The workpiece is moved past a beam of light (48) which is directed onto the manufactured surfaces of the workpiece. The pattern of light incident upon the workpiece is sensed (49) and then compared with a standard form of light pattern so as to determine any defects in the sides and chamfers of the workpiece. Conveniently, the workpiece is movable on a conveyor belt (41, 42) past illuminating (48) and sensing (49) devices, the latter of which converts the sensed pattern into electrical signals preferably digital signals, which are then compared with digital signals corresponding to a standard form of light pattern.
申请公布号 WO02097410(A1) 申请公布日期 2002.12.05
申请号 WO2002GB02513 申请日期 2002.05.30
申请人 MILLENIUM VENTURE HOLDINGS LTD.;CLOCKSIN, WILLIAM;BAKOLIAS, CHARALAMPOS 发明人 CLOCKSIN, WILLIAM;BAKOLIAS, CHARALAMPOS
分类号 G01N21/88;G01N21/956;(IPC1-7):G01N21/88 主分类号 G01N21/88
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