发明名称 DEVELOPMENT TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a development test device reducing occurrence of pulsation of frictional resistance and having good follow-up ability for smooth development action of a development structural body. SOLUTION: A fine vibration generation part 20 generating fine vibration is arranged on a first slider 12. The number of revolutions of a small motor 20a in the fine vibration generation part 20 is regulated by means of a frequency regulation part 23. The vibration force applies a bending vibration input to a second rail 15, and consequently, bending resonance vibration occurs in the second rail 15. By means of an acceleration measurement part 24 and a vibration detection part 25, a vibration condition of the second rail 15 is detected, while fine vibration always generated from the fine vibration generation part 20 is monitored, and the detected vibration frequency is informed to the frequency regulation part 23. The frequency regulation part 23 controls the respective fine vibration generation parts 20 separately or all of them integrally so that the detected vibration condition becomes a condition desirable for solving the pulsation of the frictional resistance.
申请公布号 JP2002350297(A) 申请公布日期 2002.12.04
申请号 JP20010163065 申请日期 2001.05.30
申请人 TELECOMMUNICATION ADVANCEMENT ORGANIZATION OF JAPAN;MITSUBISHI ELECTRIC CORP 发明人 SUZUKI RYUTARO;TABATA MASATAKE;FUKUSHIMA KAZUHIKO
分类号 G01M99/00;B06B1/16;B64G7/00;(IPC1-7):G01M19/00 主分类号 G01M99/00
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