发明名称 IMPACT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an impact inspection device capable of acquiring a homogeneous inspection result without depending on experience or sensitivity of an inspector. SOLUTION: This impact inspection device 1 is characterized by having sensors 6 for measuring vibration excited in an inspection object, a base member 2 having one or more sensors mounted thereon, for supporting the inspection object from below, a frequency analysis part 12 for acquiring frequency spectrum of a signal measured by the sensors, and a discrimination part 14 for discriminating the inspection object by comparing a dominant frequency of the frequency spectrum acquired by the frequency analysis part with a dominant frequency of a sound inspection object.
申请公布号 JP2002350409(A) 申请公布日期 2002.12.04
申请号 JP20010160908 申请日期 2001.05.29
申请人 MITSUBISHI HEAVY IND LTD 发明人 NEKOMOTO YOSHITSUGU;MATSUDAIRA TSUNEAKI
分类号 G01N29/12;(IPC1-7):G01N29/12 主分类号 G01N29/12
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