发明名称 APPARATUS AND METHOD FOR PREDICTING DURABILITY OF MATERIAL
摘要 <p>PROBLEM TO BE SOLVED: To provide an apparatus and a method for predicting the durability of a material which can accurately predict the durability of the material. SOLUTION: The durability predicting apparatus 100 comprises a deterioration promoting apparatus 10 (a deterioration promoting means), an electron microscope 12, an energy dispersing X-ray analyzing apparatus 1206, a film thickness measuring instrument 14, a gloss measuring instrument 16, a contact angle measuring instrument 18 and a color measuring instrument 20. The deterioration promoting apparatus 10 promotes the deterioration of a tested element T comprising the material as an object to be observed. The deterioration promoting apparatus 10 is constituted so as to allow setting a deteriorating condition to promote the deterioration of the tested element T. The electron microscope 12 electronically scans, radiates an electron beam to the tested element T after the deterioration has been promoted, and measures a shape of the tested element T. The energy dispersing X-ray analyzing apparatus 1206 detects the electron beam emitted from the tested element T and analyzes composition of the tested element T.</p>
申请公布号 JP2002350328(A) 申请公布日期 2002.12.04
申请号 JP20010162027 申请日期 2001.05.30
申请人 FUJITA CORP 发明人 KARAKI TAKUYA;KUMANO YASUKO
分类号 G01N23/223;G01J3/50;G01N17/00;(IPC1-7):G01N17/00 主分类号 G01N23/223
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