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发明名称
光学微位移传感器
摘要
一种光学微位移传感器,它包括:镜筒,设置在镜筒内一端表面镀有增透膜的凸透镜、另一端的干涉条纹接收器,设置在凸透镜与干涉条纹接收器之间表面镀有增透膜的左偏振片和右偏振片、左偏振片与右偏振片之间表面镀有增透膜的双折射晶体、镜筒上的发光器、凸透镜与左偏振片之间安装在支架上与发光器件的光轴成30°~60°夹角的反射镜。它具有测量精度高、测量范围大、不产生物理阴影等优点,可用于需测量微位移的传感器。
申请公布号
CN2524216Y
申请公布日期
2002.12.04
申请号
CN01240438.1
申请日期
2001.05.23
申请人
中国科学院西安光学精密机械研究所
发明人
贺正权;李育林
分类号
G01D5/26
主分类号
G01D5/26
代理机构
代理人
主权项
1、一种光学微位移传感器,其特征在于它包括:镜筒[1],设置在镜筒[1]内一端表面镀有增透膜的凸透镜[2]、另一端的干涉条纹接收器[7];设置在凸透镜[2]与干涉条纹接收器[7]之间表面镀有增透膜、且相互隔离的左偏振片[4]和右偏振片[6];设置在左偏振片[4]与右偏振片[6]之间表面镀有增透膜的双折射晶体[5];设置在镜筒[1]上的发光器件;它还包括设置在凸透镜[2]与左偏振片[4]之间安装在支架[8]上与发光器件的光轴成30°~60°夹角的反射镜[9]。
地址
710068陕西省西安市友谊西路234号
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