发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To provide a contact probe formable in a thin diameter while maintaining resiliency and durability of a coil spring, capable of minimizing the length while securing expandability, and contacting with a terminal of, for example, an electronic part. SOLUTION: A male shaft 2 is inserted into a guide hole 31 formed in a female shaft 3 so as to be capable of advancing and retreating. One end 4a of a compression coil spring 4 for surrounding the male shaft 2 is locked on a head part 24 of the male shaft 2. The other end 4b is locked on a step part 32 formed on the female shaft 2. In this contact probe 1, when axial directional external force turning in the female shaft 3 direction is applied against energizing force of the spring 4 to the male shaft 2, the male shaft 2 is further deeply inserted into the guide hole 31 so that the total length is shortened.
申请公布号 JP2002350463(A) 申请公布日期 2002.12.04
申请号 JP20010153384 申请日期 2001.05.23
申请人 SANYU KOGYO KK 发明人 IKEDA SHUZO
分类号 G01R31/26;G01R1/067;G01R1/073;(IPC1-7):G01R1/067 主分类号 G01R31/26
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