发明名称 VARIABLE SOCKET AND EVALUATION DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To easily carry out attachment/detachment or change of an evaluation objective element and change of a measurement condition in a short time for improving working efficiency, to allow connection or switching of a plurality of peripheral circuits to one terminal in a semiconductor circuit, and to shorten electrical connection length of the peripheral circuit, a power source, and an earth to all the terminals for reducing influence on an impedance and improving noise control. SOLUTION: In this variable socket 11, a pair of chip part contacts 15 for electrically connecting a chip part 12 freely removably and a pair of lead part contacts 14 for electrically connecting a lead part 13 freely removably are arranged in the same socket.
申请公布号 JP2002350494(A) 申请公布日期 2002.12.04
申请号 JP20010154991 申请日期 2001.05.24
申请人 RICOH CO LTD 发明人 OMORI JUNJI
分类号 G01R31/26;G01R1/073;H01R33/76;(IPC1-7):G01R31/26 主分类号 G01R31/26
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