发明名称 CIRCUIT PATTEN INSPECTION DEVICE, CIRCUIT PATTERN INSPECTION METHOD AND RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a circuit inspection device capable of positively and easily detecting a defection of a circuit board. SOLUTION: When inspecting common patterns 20 at least with end parts arranged in a row and mutually connected base parts and a flow pattern group 30 arranged between row like patterns of the common patterns 20 and not connected to other patterns, alternating current signals are alternately fed to both patterns, others are connected to a grounding level, and the alternating current signals are detected by sensors 131, 132, and 133 arranged in other end parts.
申请公布号 JP2002350481(A) 申请公布日期 2002.12.04
申请号 JP20010155533 申请日期 2001.05.24
申请人 OHT INC 发明人 YAMAOKA HIDEJI;ISHIOKA SEIGO
分类号 G01R31/02;G01R31/28;G01R31/304;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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