发明名称 METHOD, DEVICE, AND PROGRAM FOR EXTRACTING TIMING FOR STANDBY CURRENT MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To easily extract the timing for standby current measurement even in a circuit including a special cell such as an analog circuit or a special cell capable of direct control from the outside. SOLUTION: A logic simulator part 4 performs logic simulation of an object LSI through the use of circuit data, test vectors, and special cell data. In the case that it is possible to measure standby current in both the special cell and a circuit part except a special one, the standby current measuring condition determining part 5 extracts its timing as the timing for standby current measurement according to the results of the logic simulation. A test vector altering part 9 alters test vectors so that the special cell may come into a standby state at the timing. The timing for the standby current measurement is stored in a standby current measurement timing storage part 6, and circuit data at the time is stored in a signal data storage part 7.
申请公布号 JP2002350518(A) 申请公布日期 2002.12.04
申请号 JP20010160024 申请日期 2001.05.29
申请人 SONY CORP 发明人 FUKUSHIMA FUMIHIKO;OSHITA MASAHIKO
分类号 G01R31/319;(IPC1-7):G01R31/319 主分类号 G01R31/319
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