发明名称 High electron mobility transistor
摘要 A semiconductor structure, e.g., a high electron mobility transistor structure, is formed by using metamorphic growth and strain compensation. The structure includes a substrate, a graded layer over the substrate, a first donor/barrier layer over the graded layer, and a channel layer over the first donor/barrier layer. The substrate has a substrate lattice constant, and the graded layer has a graded lattice constant. The graded layer has a first lattice constant near a bottom of the graded layer substantially equal to the substrate lattice constant and a second lattice constant near a top of the graded layer different than the first lattice constant. The first donor/barrier layer has a third lattice constant, and the channel layer has a fourth lattice constant. The second lattice constant is intermediate the third and fourth lattice constants.
申请公布号 US6489639(B1) 申请公布日期 2002.12.03
申请号 US20000577508 申请日期 2000.05.24
申请人 RAYTHEON COMPANY 发明人 HOKE WILLIAM E.;LEMONIAS PETER J.;KENNEDY THEODORE D.
分类号 H01L29/201;H01L21/20;H01L21/205;H01L21/285;H01L21/335;H01L21/338;H01L29/205;H01L29/778;H01L29/812;(IPC1-7):H01L31/032 主分类号 H01L29/201
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