发明名称 METHOD OF ADJUSTING RADIOGRAPHY APPARATUS, RADIOGRAPHY APPARATUS, AND METHOD OF INSPECTING RADIOGRAPHY APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method of adjusting a radiography apparatus, a method of inspecting the radiography apparatus, and the radiography apparatus to be adjusted if necessary, capable of inspecting the layout and specification of hidden grids non-destructively, and capable of examining the condition of an image. SOLUTION: The inclination of the grids 10a disposed on the radiographing surface of the radiography apparatus is found by the analysis of the frequency of the image data obtained by applying radiation to the grids 10a and radiographing the grids, and the inclination is adjusted. Therefore, the inclination of hidden grids 10a can be found without removing the hidden grids 10a, and the position determination of the grids can be easily executed.
申请公布号 JP2002345795(A) 申请公布日期 2002.12.03
申请号 JP20020073987 申请日期 2002.03.18
申请人 KONICA CORP 发明人 ITO TAKESHI
分类号 A61B6/00;(IPC1-7):A61B6/00 主分类号 A61B6/00
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