发明名称 Method and apparatus for calibrating an instrument
摘要 A method for calibrating an instrument includes maintaining typical response values at respective frequency locations. The response of the instrument being calibrated is measured at a subset of frequency locations in the typical response. Response values for frequency locations not in the subset are estimated from the typical and measured response values. The instrument is calibrated based on the actual and estimated response values. Apparatus for calibrating an instrument includes a signal generator, coupled to the instrument, which generates a signal having known characteristics. A controller, coupled to the instrument, generates a calibration signal. Controller memory stores typical response values at respective frequency locations, and measures response values at a subset of the frequency locations. Response values for frequency locations not in the subset are estimated from the typical and measured response values. The instrument is calibrated in response to the measured and estimated response values.
申请公布号 US6490535(B1) 申请公布日期 2002.12.03
申请号 US19990293493 申请日期 1999.04.15
申请人 TEKTRONIX, INC. 发明人 HANSEN VICTOR L.
分类号 G01R35/00;(IPC1-7):G01R35/00 主分类号 G01R35/00
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