发明名称 LOW DIELECTRIC CONSTANT MATERIAL AND TREATMENT METHOD BY CVD
摘要 PURPOSE: An organo fluorosilicate glass film and its preparation method by CVD (chemical vapor deposition) are provided, wherein the film has a low dielectric constant and can be applied for various uses in electronics. CONSTITUTION: The organo fluorosilicate glass film is represented by SivOwCxHyFz, wherein v+w+x+y+z is 100%, v is 10-35 atomic%, w is 10-65 atomic%, y is 10-50 atomic%, x is 2-30 atomic%, z is 0.1-15 atomic% and practically none of the fluorine atom is bonded to the carbon atom. Preferably x/z is greater than 0.25. The method comprises the steps of providing a substrate within a vacuum chamber; introducing into the vacuum chamber the gaseous reagents comprising a fluorine-providing gas, an oxygen-providing gas and at least one precursor gas selected from the group consisting of an organosilane and an organosiloxane; and applying energy to the gaseous reagents in the chamber to induce the reaction of the gaseous reagents and to form the film on the substrate.
申请公布号 KR20020090144(A) 申请公布日期 2002.11.30
申请号 KR20020028368 申请日期 2002.05.22
申请人 发明人
分类号 C23C16/42;C03C3/04;C03C14/00;C23C16/30;C23C16/40;H01B3/12;H01L21/312;H01L21/316;H01L21/768;H01L23/522;(IPC1-7):H01B3/12 主分类号 C23C16/42
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