发明名称 INSPECTION JIG OF PERFORMANCE BOARD FOR CHIP SORTING PROCESS
摘要 PURPOSE: An inspection jig of performance board for chip sorting process is provided to check thickness and flatness of a performance board and a position, a diameter, and an interval of a hole. CONSTITUTION: An outer inspection pin(112) is formed at the outside of a jig plate(110) corresponding to a hole formed within a performance board. An inner inspection pin(114) is formed in the inside of the jig plate(110). The outer inspection pin(112) and the inner inspection pin(114) are projected from the jig plate(110). A couple of holes within the performance board and the inspection pins(112,114) have the same position and the same diameter. The performance board is loaded on the jig plate(110). The diameter, position and thickness of the performance board can be measured by examining whether the inspection pin(112,114) on the inspection jig plate corresponds to the hole of the performance board.
申请公布号 KR20020089653(A) 申请公布日期 2002.11.30
申请号 KR20010028485 申请日期 2001.05.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, GAP RYEOL;KO, YEONG NAM;LEE, HO YEOL;NAM, DO HYEON
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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