发明名称 IRROTATIONAL-TYPE THIN FILM FORMATION APPARATUS
摘要 PURPOSE: An irrotational-type thin film formation apparatus is provided to minimize a generation of fine dusts and turbulence due to rotation by arranging a plurality of ports for spraying and exhausting gas to wafer around instead of a rotational axis. CONSTITUTION: The irrotational-type thin film formation apparatus comprises a semiconductor substrate(10), a plurality of gas spray ports(11-a,11-b,11-c) arranged same distance around of the substrate(10), a plurality of gas exhaust ports(12-a,12-b,12-c) arranged same distance between the gas spray ports, and a reaction tube(13). Instead of rotation of the wafer, the gas spray ports(11-a,11-b,11-c) and the gas exhaust ports(12-a,12-b,12-c) corresponding to the gas spray ports(11-a,11-b,11-c) are sequentially operated according to the around of the semiconductor substrate(10), thereby improving a uniformity of deposited thin film.
申请公布号 KR20020088619(A) 申请公布日期 2002.11.29
申请号 KR20010027381 申请日期 2001.05.18
申请人 PST CO., LTD. 发明人 CHOI, JONG MUN;LEE, BEOM HUI;LEE, GYEONG BOK;LEE, JAE HYEONG;PARK, JAE GYUN;YOO, JAE AN
分类号 H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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