发明名称 |
SINGLE ELECTRONIC MEMORY ELEMENT COMPRISING QUANTUM POINT BETWEEN GATE ELECTRODE AND SINGLE ELECTRONIC STORAGE ELEMENT, AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a single electronic memory element together with its manufacturing method wherein a sufficient time for appropriately holding information is assured while an element is prevented from degrading in characteristics, when a quantum point or an element having an effect similar to it is formed. SOLUTION: The single electronic memory element comprises a substrate where a channel region of nano scale is formed between a source and a drain, and a gate lamination pattern comprising a quantum point in the channel region. The gate lamination pattern is a single electronic memory element comprising a lower part layer formed in the channel region, a single electronic storage medium in which, formed on the lower part layer, a single electron tunneling the lower part layer is accumulated, an upper part layer which is formed on the single electronic storage medium and comprises a quantum point, and a gate electrode which is so formed on the upper part layer as to contact the quantum point.</p> |
申请公布号 |
JP2002343938(A) |
申请公布日期 |
2002.11.29 |
申请号 |
JP20010396008 |
申请日期 |
2001.12.27 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
CHAE SOO-DOO;KIN HEIBAN;KIN BUNKEI;CHAE HEE-SOON;RYU GENICHI |
分类号 |
G11C16/04;H01L21/28;H01L21/8247;H01L27/10;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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