发明名称 |
APPARATUS FOR ETCHING WAFER BACK |
摘要 |
PROBLEM TO BE SOLVED: To fundamentally prevent wafer damage in the separation of a wafer where etching has been completed in a process for etching a wafer back. SOLUTION: Etching liquid is supplied into an etching tank 45 through a supply section 35 fitted onto a lower surface, a wafer back arranged on the support rest 42 at the upper end of an etching dam is uniformly etched by the flow of the etching liquid, and the etching liquid for generating surface tension after the etching is completed is discharged from the etching tank 45 through a first discharge section 47.
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申请公布号 |
JP2002343764(A) |
申请公布日期 |
2002.11.29 |
申请号 |
JP20010234668 |
申请日期 |
2001.08.02 |
申请人 |
SAMSUNG ELECTRO MECH CO LTD |
发明人 |
RYU YUNG-HO;NAM HYUNG-HEE;JUNG HO-PHIL |
分类号 |
C23F1/08;H01L21/00;H01L21/30;H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
C23F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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