发明名称 APPARATUS FOR MONITORING RADIATION WAVELENGTH OF LASER
摘要 PROBLEM TO BE SOLVED: To provide a low-cost small-sized wavelength monitoring system. SOLUTION: An apparatus for monitoring the radiation wavelength of a laser (10) comprises a semiconductor slice or slab (14), having first and second opposed surfaces (141, 142). A part of the slice (14) is exposed to radiation at an angle so as to be incident on the first surface (141) at an angle in the vicinity of the Brewster angle to the first surface (141). Accordingly, the radiation is refracted into the slice (14), and propagated toward the second surface (142) of the slice (14). The apparatus further comprises a wavelength selection filter (15), disposed on the second surface (142) having an associated photodetector (11), which generates a signal (110) indicative of the wavelength of the radiation.
申请公布号 JP2002344078(A) 申请公布日期 2002.11.29
申请号 JP20020129643 申请日期 2002.05.01
申请人 AGILENT TECHNOL INC 发明人 LANO ROBERTO;DELPIANO FRANCO;CONTARDI CRISTIANA
分类号 G01J9/00;G01J9/02;H01S5/022;H01S5/0687;(IPC1-7):H01S5/068 主分类号 G01J9/00
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