| 摘要 |
PROBLEM TO BE SOLVED: To conduct various kinds of testing for characteristic of optical semiconductor in a state with the wavelength locked, in a wavelength locker module having a function to lock the wavelength and a wavelength variable laser module utilizing the wavelength locking function, by feedback of wavelength of an output light detected by a wavelength monitor and by conroling the temperature of the module. SOLUTION: The temperature of a wavelength locker module is changed by a temperature control power supply 7, the output of a wavelength monitor 52 is detected within the changed range by a wavelength monitor bias circuit 61, and the correlation between the temperature of a semiconductor laser and the wavelength of an output light is calculated. In addition, while a wavelength monitor output is fed back through a wavelength feedback circuit 6, on the basis of the obtained correlation, the temperature of the wavelength locker module is controlled to make the wavelength of the output light locked.
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