发明名称 |
TREATMENT METHOD OF SILICON WAFER |
摘要 |
PROBLEM TO BE SOLVED: To reduce an aggregate comprising a particle and an organic matter caused by a polishing process. SOLUTION: This treatment method of silicon wafers includes a polishing process 12 for polishing the surface of a wafer where chemical etching treatment 11 is performed by polishing liquid containing a polishing particle, a first washing process 17 for washing the surface of the wafer by first washing liquid containing hydrogen peroxide and ammonium hydroxide, and a second washing process 18 for washing the surface of the wafer by second washing liquid containing the hydrogen peroxide and diluted hydrochloric water acid. The treatment method should include a pretreatment washing process 16 for washing the wafer by third washing liquid containing an amine-based compound or the amine-based compound and a surface-active agent.
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申请公布号 |
JP2002343752(A) |
申请公布日期 |
2002.11.29 |
申请号 |
JP20010151778 |
申请日期 |
2001.05.22 |
申请人 |
SUMITOMO MITSUBISHI SILICON CORP |
发明人 |
OKUUCHI SHIGERU;WATANABE TOSHIHIKO;TAKAISHI KAZUNARI |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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