发明名称 TREATMENT METHOD OF SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To reduce an aggregate comprising a particle and an organic matter caused by a polishing process. SOLUTION: This treatment method of silicon wafers includes a polishing process 12 for polishing the surface of a wafer where chemical etching treatment 11 is performed by polishing liquid containing a polishing particle, a first washing process 17 for washing the surface of the wafer by first washing liquid containing hydrogen peroxide and ammonium hydroxide, and a second washing process 18 for washing the surface of the wafer by second washing liquid containing the hydrogen peroxide and diluted hydrochloric water acid. The treatment method should include a pretreatment washing process 16 for washing the wafer by third washing liquid containing an amine-based compound or the amine-based compound and a surface-active agent.
申请公布号 JP2002343752(A) 申请公布日期 2002.11.29
申请号 JP20010151778 申请日期 2001.05.22
申请人 SUMITOMO MITSUBISHI SILICON CORP 发明人 OKUUCHI SHIGERU;WATANABE TOSHIHIKO;TAKAISHI KAZUNARI
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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