发明名称 PLASMA TREATMENT EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To enable stable end point detection by making reaction product difficult to stick on an inside (vacuum side) surface of a viewing port, in the case that the number of treated substrates is increased. SOLUTION: A shield plate 10 for isolating a chamber A in which a substrate 1 to be treated is subjected to plasma treatment from a chamber B interconnected with discharge means 2 is installed in a vacuum vessel 1, and the vacuum vessel 1 and the shield plate 10 are grounded. The shield plate 10 has a hole. The viewing port 13 is installed in the chamber B which is isolated by the shield plate 10 and interconnected with the discharge means, and an end point detector 14 of plasma treatment is installed on the viewing port. Thereby leakage of plasma from the chamber in which plasma treatment is performed is prevented, reaction product is hardly stuck on the inside surface of the viewing port, and stable end point detection is enabled.
申请公布号 JP2002343724(A) 申请公布日期 2002.11.29
申请号 JP20010149004 申请日期 2001.05.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MAEKAWA YUKIHIRO;OKUMURA TOMOHIRO;MATSUDA IZURU
分类号 H05H1/46;C23C14/34;C23C16/509;H01L21/205;H01L21/302;H01L21/3065 主分类号 H05H1/46
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