| 摘要 |
A low capacitance probe tip and socket for a measurement probe has a probe tip extending through an insulating plug and a recess defining a socket formed in the plug. The socket has an aperture formed therein that provides access the low capacitance probe tip. An electrically conductive contact is disposed in the aperture that extends into the socket and is in electrical contact with the low capacitance probe tip. In one embodiment, the socket is formed parallel to the low capacitance probe tip. In a further embodiment, the socket is formed at an angle to the low capacitance probe tip with the electrically conductive contact being an electrically conductive elastomeric material disposed at the distal end of the socket in electrical contact with the low capacitance probe tip.
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