发明名称 Sub-micron high input voltage tolerant input output (I/O) circuit which accommodates large power supply variations
摘要 A method of providing bias voltages for input output connections on low voltage integrated circuits. As integrated circuit voltages drop generally so does the external voltages that those circuits can handle. By placing input and output devices, in series, external voltages can be divided between the devices thereby reducing junction voltages seen by internal devices. By using external voltages as part of a biasing scheme for integrated circuit devices, stress created by the differential between external voltages and internal voltages can be minimized. Additionally device wells can be biased so that they are at a potential that is dependent on the external voltages seen by the low voltage integrated circuit.
申请公布号 US2002175743(A1) 申请公布日期 2002.11.28
申请号 US20020043763 申请日期 2002.01.09
申请人 AJIT JANARDHANAN S. 发明人 AJIT JANARDHANAN S.
分类号 H01L27/02;H02H9/00;H03K19/003;(IPC1-7):H03K3/01 主分类号 H01L27/02
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