发明名称 ELECTRICAL COMPONENT MEASURING INSTRUMENT
摘要 <p>The present invention provides a method and system for generating a distinct signature of electronic components that is compared to a known signature for identification and verification of the electronic component. The component signature is displayed on an alpha-numeric display (38) for viewing by the user, or can be used as a pointer in a look-up table (68) for displaying a string of text (36) corresponding to the signature. In a digital generation method, a test sequence is executed (56), wherein a predetermined combination of logic levels are applied to the pins of a component. The logic levels applied to each pin are then compared to their respective feed-back logic levels. The sum of all the differences between the feed-back logic levels and the applied logic levels at the end of the test sequence is used in generating a signature. In an analog generation method, values calculated as a function of the waveform response of the component are used to generate a signature for the component.</p>
申请公布号 WO2002095429(A2) 申请公布日期 2002.11.28
申请号 CA2002000726 申请日期 2002.05.21
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