发明名称 |
Semiconductor memory device |
摘要 |
When address signal bits and/or data bits in a predetermined pattern are accessed a predetermined number of times successively, a test mode can be set. By using address signal bits and/or data bits as a test command for designating a test content, a test content is specified. A semiconductor memory device with an interface compatible with an interface of a normal static random access memory is provided.
|
申请公布号 |
US2002176297(A1) |
申请公布日期 |
2002.11.28 |
申请号 |
US20020120445 |
申请日期 |
2002.04.12 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MAKABE RYU;TSUKUDE MASAKI;SATO HIROTOSHI |
分类号 |
G11C11/403;G11C11/401;G11C29/14;G11C29/46;(IPC1-7):G11C29/00 |
主分类号 |
G11C11/403 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|