发明名称 Method of fabricating a vertical insulated gate transistor with low overlap of the gate on the source and the drain, and an integrated circuit including this kind of transistor
摘要 The vertical transistor includes, on a semiconductor substrate, a vertical pillar 5 having one of the source and drain regions at the top, the other of the source and drain regions being situated in the substrate at the periphery of the pillar, a gate dielectric layer 7 situated on the flanks of the pillar and on the top surface of the substrate, and a semiconductor gate resting on the gate dielectric layer. The gate includes a semiconductor block having a first region 800 resting on the gate dielectric layer 7 and a second region 90 facing at least portions of the source and drain regions and separated from those source and drain region portions by dielectric cavities 14S, 14D.
申请公布号 US2002177265(A1) 申请公布日期 2002.11.28
申请号 US20020114329 申请日期 2002.04.02
申请人 STMICROELECTRONICS S.A. 发明人 SKOTNICKI THOMAS;JOSSE EMMANUEL
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/28
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