发明名称 |
Method for forming phase-change memory bipolar array utilizing a single shallow trench isolation for creating an individual active area region for two memory array elements and one bipolar base contact |
摘要 |
The invention relates to a process of forming a phase-change memory device. The process includes forming a salicide structure in peripheral logic portion of the substrate and preventing forming salicide structures in the memory array. The device may include a double-wide trench into which a single film is deposited but two isolated lower electrodes are formed therefrom. Additionally a diode stack is formed that communicates to the lower electrode.
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申请公布号 |
US2002177292(A1) |
申请公布日期 |
2002.11.28 |
申请号 |
US20020196870 |
申请日期 |
2002.07.15 |
申请人 |
DENNISON CHARLES |
发明人 |
DENNISON CHARLES |
分类号 |
H01L27/24;H01L29/68;(IPC1-7):H01L21/823;H01L21/320;H01L21/476 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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