发明名称 Method for forming phase-change memory bipolar array utilizing a single shallow trench isolation for creating an individual active area region for two memory array elements and one bipolar base contact
摘要 The invention relates to a process of forming a phase-change memory device. The process includes forming a salicide structure in peripheral logic portion of the substrate and preventing forming salicide structures in the memory array. The device may include a double-wide trench into which a single film is deposited but two isolated lower electrodes are formed therefrom. Additionally a diode stack is formed that communicates to the lower electrode.
申请公布号 US2002177292(A1) 申请公布日期 2002.11.28
申请号 US20020196870 申请日期 2002.07.15
申请人 DENNISON CHARLES 发明人 DENNISON CHARLES
分类号 H01L27/24;H01L29/68;(IPC1-7):H01L21/823;H01L21/320;H01L21/476 主分类号 H01L27/24
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