| 摘要 |
A semiconductor integrated circuit device which shortens the time required for testing a divided logic circuit to reduce test cost and a fault-detecting method therefor. The logic circuit is divided into N logic blocks using N+1 scan paths comprises of scan flip-flops each having selectors for selectively picking up the output signals of storage elements which are fed back to the storage elements. A common scan operation may then be carried out on these logic blocks (Logic 1-to Logic N), and a testing operation may be continuously carried out on the logic blocks. The present invention preferably eliminates the overlaps in conventional scan operations, resulting in a shorter test time.
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