| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method enabling measuring a specimen even when the specimen is in an uneven state or includes many impurities, and an inexpensive apparatus and an inexpensive method enabling mapping the specimen. SOLUTION: The apparatus 2 for measuring the surface distribution of a protein secondary structure has an infrared light irradiating means 6, a detecting means 8, a storage means 10 in which a spectrum of a preliminarily measured specific protein secondary structure is stored as data, an analyzing means 12 for figuring out a spectrum from the detected result obtained by the detecting means 8, comparing the spectrum with the spectrum of the specific protein secondary structure stored in the storage means 10, and calculating an abundance ratio of the specific protein secondary structure from the comparison result, and a display means 14 for displaying the measured result of the surface distribution state of the abundance ratio of the specific protein secondary structure in the whole or in a specific range of the samples.</p> |
