发明名称 FLUORESCENT X-RAY ANALYZING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzing device capable of obtaining the stable fluorescent X-ray intensity even if rugged parts exist in a sample surface. SOLUTION: Shape of an opening part 3 of a primary X-ray diaphragm 3 is set so that a change of the intensity of the fluorescent X-ray 7 to be measured by a detecting means 8 is restricted at 1% or less when height of the sample surface 5a in relation to an X-ray source 1 and the detecting means 8 is changed at 1 mm as the maximum.
申请公布号 JP2002340824(A) 申请公布日期 2002.11.27
申请号 JP20010144176 申请日期 2001.05.15
申请人 RIGAKU INDUSTRIAL CO 发明人 KAWAHARA NAOKI;AOYANAGI KOICHI;YAMADA KOJIRO
分类号 G01N23/223;G21K1/02;(IPC1-7):G01N23/223 主分类号 G01N23/223
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