发明名称 |
FLUORESCENT X-RAY ANALYZING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzing device capable of obtaining the stable fluorescent X-ray intensity even if rugged parts exist in a sample surface. SOLUTION: Shape of an opening part 3 of a primary X-ray diaphragm 3 is set so that a change of the intensity of the fluorescent X-ray 7 to be measured by a detecting means 8 is restricted at 1% or less when height of the sample surface 5a in relation to an X-ray source 1 and the detecting means 8 is changed at 1 mm as the maximum. |
申请公布号 |
JP2002340824(A) |
申请公布日期 |
2002.11.27 |
申请号 |
JP20010144176 |
申请日期 |
2001.05.15 |
申请人 |
RIGAKU INDUSTRIAL CO |
发明人 |
KAWAHARA NAOKI;AOYANAGI KOICHI;YAMADA KOJIRO |
分类号 |
G01N23/223;G21K1/02;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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