METHOD FOR PROCESSING PROBE FOR USE IN SCANNING PROBE MICROSCOPE AND PROBE PROCESSED BY THE METHOD

摘要

PROBLEM TO BE SOLVED: To provide a method for processing a probe such that a scanning probe microscope can recognize positional relation between the probe and the target position of a sample optically. SOLUTION: In the method for processing a cantilever type probe (cantilever 19 provided with a probe 21) being built in a scanning probe microscope, the cleaned cantilever 19 is subjected to silane processing and then an amino group is attached to the surface. The cantilever 19 applied with amino group is then immersed into FITC(fluorescent isothiocyanate) solution and the amino group is bonded to FITC. Following the silane processing, the cantilever 19 is cleaned with pure water. Consequently, the cantilever 19 is subjected to fluorescent treated.