发明名称 |
METHOD OF PROCESSING WAFER |
摘要 |
PROBLEM TO BE SOLVED: To improve a yield by ensuring the protection of the wafer surface to be protected in a method of processing the wafer. SOLUTION: In subjecting the one surface of the wafer 3 to prescribed processing, a peelable protective sheet 4 is deposited on one surface to be protected of the wafer 3 and the other surface of the wafer 3 is subjected to the prescribed processing. |
申请公布号 |
JP2002341548(A) |
申请公布日期 |
2002.11.27 |
申请号 |
JP20010148115 |
申请日期 |
2001.05.17 |
申请人 |
SONY CORP |
发明人 |
FUJISAWA NORIKATSU;HONDA JUNICHI |
分类号 |
G03F7/16;G03F7/20;H01L21/027;H01L21/306;H01L41/08;H01L41/22;H01L41/23 |
主分类号 |
G03F7/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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