发明名称 METHOD OF PROCESSING WAFER
摘要 PROBLEM TO BE SOLVED: To improve a yield by ensuring the protection of the wafer surface to be protected in a method of processing the wafer. SOLUTION: In subjecting the one surface of the wafer 3 to prescribed processing, a peelable protective sheet 4 is deposited on one surface to be protected of the wafer 3 and the other surface of the wafer 3 is subjected to the prescribed processing.
申请公布号 JP2002341548(A) 申请公布日期 2002.11.27
申请号 JP20010148115 申请日期 2001.05.17
申请人 SONY CORP 发明人 FUJISAWA NORIKATSU;HONDA JUNICHI
分类号 G03F7/16;G03F7/20;H01L21/027;H01L21/306;H01L41/08;H01L41/22;H01L41/23 主分类号 G03F7/16
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