发明名称 APPARATUS AND METHOD FOR MEASURING COMPONENT CONCENTRATION OF OBJECT
摘要 <p>PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring the component concentration of an object. SOLUTION: There are provided a pumping light source for irradiating an incident light having a single wavelength with a predetermined or larger peak power, a first wavelength-converting part for converting the incident light to a light having at least one discrete wavelength and outputting the light, a first beam-splitting part for splitting the light outputted from the first wavelength-converting part and illuminating the object with one of the split light, a reference light-generating part for converting the other of the light split by the first beam-splitting part to a parallel light, separating the light converted to the parallel light by each wavelength, and outputting the separated result as a reference light, a first collimator part for converting light passing the object to a parallel light and outputting the light, a luminous intensity-measuring part for measuring a luminous intensity for each wavelength of the light outputted from the first collimator part and the reference light with the use of the reference light, and a concentration-measuring part for measuring the component concentration from the luminous intensity for each wavelength measured by the luminous intensity- measuring part.</p>
申请公布号 JP2002340796(A) 申请公布日期 2002.11.27
申请号 JP20020025108 申请日期 2002.02.01
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HWANG IN-DUK;YOON GIL-WON
分类号 A61B5/00;A61B5/145;A61B5/1455;G01J3/42;G01N21/25;G01N21/31;G01N21/35;G01N21/3577;G01N21/359;G02B6/00;G02B6/02;(IPC1-7):G01N21/35 主分类号 A61B5/00
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