CIRCUIT AND METHOD FOR CONTROLLING TEST ON INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a circuit and method for controlling test on integrated circuit by which communication paths between objects in an integrated circuit and between the outside of the integrated circuit and the objects can be tested efficiently. SOLUTION: At the time of testing the communication path of a portion incorporated in the integrated circuit, a first communication path is formed in the communication path and the test is performed by making prescribed data to flow to the formed first communication path.