| 摘要 |
PROBLEM TO BE SOLVED: To check whether normal pattern data are executed in the case of function test of a device to be measured. SOLUTION: A device program is prepared corresponding to a device to be measured and used for the function test of the device. Pattern data are described in the device program to be used by program execution. This pattern data checking circuit is provided with a parity pattern memory for storing results obtained by previously executing parity operation to values of the pattern data as expected data, a parity operating circuit 20 for executing parity operation to the pattern data used by executing the device program when the device to be measured is tested, and a mismatch detecting circuit 21 for detecting the mismatch between the operation results by the parity operating circuit 20 and the expected data stored in the parity pattern memory 14.
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