摘要 |
PURPOSE: A debugging system for a semiconductor integrated circuit is provided to readily debug the entire LSI in a low-cost and simple configuration. CONSTITUTION: The system for debugging a designated semiconductor integrated circuit, comprising a board having a plurality of debugging semiconductor integrated circuits, each of the debugging semiconductor integrated circuits having the same configuration as that of the designated semiconductor integrated circuit, and analyzing means for collecting different internal signals from the respective debugging semiconductor integrated circuits while the debugging semiconductor integrated circuits are under the same operation condition, and for analyzing the operation of the designated semiconductor integrated circuit based on the collected internal signals.
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