| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit tester and a circuit testing method which enable test under applicable test circumstances, and can reduce design preparation of input data and test time. SOLUTION: An input part path which is a path from an input terminal of a logic circuit capable of reconstitution to a prescribed assembling part via a test control circuit is set. A connection part path which is a path in a connection part between the prescribed assembling part and a prescribed variable part is set from the assembling part to all directions as viewed in adjacent assembling parts, and from the adjacent assembling parts to all directions viewing further adjacent assembling parts, and an output part path which a path from a prescribed variable part PP as far as an external output terminal of an integrated circuit is set. Data are inputted in the input part path, and data which reach the external output terminal via the input part path, the connection part path and the output part path are measured. |
