MARK, CTP PLATE AND CTP PLATE ACCURACY INSPECTION METHOD AND DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an efficient CTP plate quality inspection method and device capable of accurately inspecting the quality of a CTP plate with less work loads, a mark for enabling the inspection, and the CTP plate on which the mark is formed. SOLUTION: The mark is attached at the four corners of the CTP plate or the exposure limit area thereof. On the CTP plate, the mark is attached at the four corners. In the CTP plate accuracy inspection method, the accuracy of the outer shape dimension and exposure position on the CTP plate is inspected on the basis of the mark attached at the four corners of the CTP plate or the exposure limit area. To the CTP plate accuracy inspection device, the method is applied.