发明名称
摘要 <p>The contact error of a contact section which is brought into contact with an IC card is detected reliably. The level of a reset signal which is supplied to a reset terminal (RST) of an integrated circuit (21) mounted on an IC card (20) through a contact section (11) is controlled to be low and, also, the level of a clock signal which is supplied to a clock terminal (CLK) of the integrated circuit through the contact section is controlled to be low. After that, power for the integrated circuit (21) is supplied to a power supply terminal (Vcc) of the integrated circuit (21) through the contact section (11). At that time, the voltage which is outputted from an I/O terminal (I/O) of the integrated circuit (21) through the contact section (11) is compared with a predetermined reference level by a comparator (16). When the voltage is lower than the predetermined reference level, it is judged to be contact error of the contact section. <IMAGE></p>
申请公布号 JP3351498(B2) 申请公布日期 2002.11.25
申请号 JP19960147347 申请日期 1996.06.10
申请人 发明人
分类号 G06K17/00;G06K7/00;G11C5/00;(IPC1-7):G06K17/00 主分类号 G06K17/00
代理机构 代理人
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