| 摘要 |
PROBLEM TO BE SOLVED: To reduce scale of circuit by constituting a FIFO memory device using scan chain in a function block being not yet used by utilizing effectively a function block not to be used. SOLUTION: In a semiconductor integrated circuit designed so as to test easily using scan FF, the device is provided with a selector in which scan chain of a circuit block being not functioned during operation using a FIFO memory device is used as a memory section of the FIFO memory device and a scan input and a FIFO input are selected, and a multiplexer selecting data initially selected and outputted it. Thereby, as the FIFO memory device is not required to provided exclusively, the scale of circuit can be reduced. |
