DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To test an integrated circuit without changing the constitution of the integrated circuit of a testing object and without providing a large capacity of test vector memory. SOLUTION: This integrated circuit testing device is provided with a data word generator for supplying a decision theoretic data word to evade the test vector memory and a system on a substrate, a test pattern generating means for changing the decision theoretic data word to generate a commanded test pattern able to be supplied to an input of the integrated circuit of the testing object, and a comparison means for comparing a test output pattern of the integrated circuit with a desirable output pattern.